Application of N3200 series in high voltage semiconductor testing

The development of power management technology has been moving towards higher conversion efficiency, higher power density and lower cost. From the history of electronic development, in power and industrial applications such as AC motor control, UPS, Hybrid and EV vehicles, the need to maintain a variety of controllable cable specifications has driven power conversion to higher voltages. The semiconductor devices selected for this type of voltage are mostly thyristors, and technological innovations in the manufacture and material processes of this device are also driving the development of IGBTs and MOSFETs, whose voltage ratings are as high as several thousand volts. In possible applications, using IGBTs or MOSFETs instead of thyristors can achieve power conversion at high switching frequencies. The size of passive components used in the design is reduced in the higher frequency transfer, thereby improving energy efficiency.

Based on the many years experience of R&D and design in the field of measurement and control of electronic. We have developed the N3200 series of high voltage programmable DC power supplies specifically for high voltage circuit test scenarios. The N3200 series has a voltage output capability of 10kV, and its voltage and current resolutions reach 0.1V/0.1μA respectively. The 2U ½ 19' small size design can be used for both benchtop test and integrated system test. The high-definition 4.3-inch LCD display can display the complete test information.
Taking the testing of high-voltage semiconductor devices as an example, the basic characteristic analysis usually involves the breakdown voltage research. This parameter helps semiconductor device designers quickly determine whether the device is qualified. Now let's take a look at the advantages and performance of the NGI N3200 series high-voltage DC power supply in high-voltage semiconductor device testing.

● Adapted to the high-voltage circuit test environment

The breakdown voltage can be measured by applying an increasing reverse voltage to the device until a certain test current is reached at which the device is broken down. The N3200 series high-voltage power supply is a bipolar power supply that can switch the output of positive and negative voltages with one button, which can reduce the wiring procedure when applying reverse voltage. The N3225-5K-M005 and N3210-10K-M001 models have voltage ranges of ±5kV and ±10kV respectively, which are sufficient to meet the requirements of the high-voltage circuit environment for the breakdown voltage measurement of high-voltage devices.

● Safe and reliable high-voltage test system

When conducting high-voltage tests, the voltage of the power supply is generally as high as several thousand volts, so safety protection is the primary issue, and the test equipment must have sufficient safety protection measures. The N3200 series high-voltage power supply has the following functional designs for safety issues:

•I-Trip function, when the set current value is higher than the protection current value, the device will stop the current output
•V-Limit function, when the set voltage value is greater than the protection voltage value, the device will issue a reminder that it exceeds the limit
•Using a high-voltage dedicated plug with the system's maximum voltage rating, the test engineer can connect the high-voltage line and the DUT to the high-voltage plug in turn to ensure safety.

Additional note: When using our equipment for testing, in order to ensure that the operator is not exposed to dangerous voltages, the device under test (DUT) must be enclosed, and any exposed joints must be grounded in the correct way.

With its wide voltage range, precise current measurement, and high standard safety factor, the NGI N3200 series high-voltage programmable DC power supply can perfectly adapt to a variety of high-voltage circuit environments that require precise current measurement, and can effectively promote the electrical performance research of high-voltage devices, components, and semiconductor.