Application of NGI dc power supply in AFE RF and laser chip test

With the continuous upgrading of semiconductor materials and manufacturing processes, small size and high performance have become an important development trend of chip devices, which means that the requirements for chip signal acquisition, processing, power consumption and other performances will become higher and higher. Therefore, this also puts forward higher standards and requirements for important indicators such as accuracy, stability and integration of chip test devices.

● AFE chip test

AFE chip is a chip used for analog signal acquisition and processing. It can amplify, filter, sample and quantize the input signal. At present, AFE chips have been widely used in electric vehicles, energy storage, medical and other fields. Taking electric vehicles as an example, AFE chips are an important hardware basis for the acquisition of parameters such as battery voltage and temperature of automobiles. Therefore, the accuracy of its voltage acquisition accuracy and static power consumption are the focus of attention of the entire electric vehicle industry chain upstream and downstream.

● RF chip test

RF chip is a device that amplifies, filters, switches and processes signals. It is widely used in radar, communication, 3C electronics and other fields. The test process of RF chips has high requirements for power supply.
During the test process, the ripple of the power supply equipment can easily cause unstable fluctuations and confusion in the signal output of the chip. Therefore, the output ripple and stability of the power supply will have a significant impact on the test accuracy of the RF chip.
The space occupied by a single power supply will also directly affect the test efficiency. Taking the traditional desktop measurement and control power supply as an example, multiple devices are required to build a test system. In addition, to test the leakage current of the chip, the conventional test method must be matched with a high-precision digital multimeter, which requires additional test space and further affects the test efficiency.

● Semiconductor laser chip test

Semiconductor lasers have been widely used in material processing, optical communications, national defense, medical and other fields, and laser chips are the core components of lasers. At present, the constant current aging test of laser chips has been carried out throughout the entire process of chip research and development, production, and quality control. During the aging test of the laser chip, the power supply is prone to current process at the moment of startup. If it is not handled properly, it is easy to burn the chip as the object of test. In addition, if the power supply does not support the sequence mode, the progress of the entire test will be very slow and inefficient.

● NGI solution

For various potential problems of test equipment faced by various chip testing processes, we will recommend our independently developed N23010/N23020 series of high-precision multi-channel programmable DC power supplies to you. The relevant models can be widely used in the electrical performance testing of various chips. The relevant products have the following features:
High precision: The voltage accuracy can reach up to 0.1mV, which can meet the voltage test requirements of mainstream AFE chips on the market;
High integration: Up to 24 channels can be integrated in 3U space, which can save more than 50% space compared to traditional desktop power supplies, and can perfectly adapt to large-scale testing scenarios such as packaging and testing, wafer production, and production;
Rich functions: Supporting nA-level current measurement can meet the needs of chip or panel leakage current testing, which can save customers additional high-precision digital multimeter procurement costs.