Application of NGI test system in automotive BCM test

Automotive electronics plays an important role in the automotive design process. The application of automotive electronics technology in automobiles has gradually affected the safety, comfort, and convenience of operation of automobiles. In addition, the electrification and intelligence of automobiles have become a trend. Most vehicle manufacturers are carrying out engineering development of automotive parts and components related to automotive electronics technology.

Body control module, referred to as BCM, is an important part of the body electrical system. The hardware of BCM consists of three parts: input control circuit, central control chip (main chip MCU), and output control circuit. The input control circuit collects the sensor or input signal (analog signal or digital signal) of BCM, and the control circuit demodulates and processes the signal and transmits it to the main chip. The analog signal cannot be directly recognized and processed by the control main chip. The analog signal is converted into a digital signal through the A/D conversion circuit of the input circuit, and then transmitted to the central control chip (main chip) for input signal processing. After logical judgment through the control strategy of the body controller, the output signal is generated and transmitted to the output circuit of the body controller through the output circuit to control the normal operation of the automotive body electrical system such as the window motor, door lock motor, headlight, wiper and washing motor and other components. The working principle of the body controller is shown in the figure below:

BCM can significantly affect the safety, ride comfort and driving convenience of the car, and the control model construction, functional testing and fault injection simulation testing of BCM will directly affect its pass rate.
NGI can build a matching test system for the diversified testing of BCM. Our DC power supply, DC electronic load, high-speed data acquisition card (AIO), high-speed digital IO card (DIO), PWM input and output card, CAN communication conversion card and other test instruments can build different test systems to meet the testing requirements of different BCM products.
The general steps of the entire test process are as follows: when the test system is built and connected to the object under test, the input and output signals of BCM begin to match the signals with the host computer software, and the host computer software control interface simulates the input signal of BCM for functional debugging. Use the host computer software to edit the test plan for manual or automatic testing to verify the correctness of the BCM control model design strategy. On the other hand, after the host computer software completes the functional debugging, it can simulate the electrical fault state of BCM and perform input and output fault injection tests on BCM respectively. Then BCM stores the fault code data in the control chip (MCU), the host computer software parses the fault code data through the CAN bus, and the test data is imported into the fault injection test report. Overall, this is our test system's control model strategy verification test and fault injection simulation test for BCM.

● Solution Features

The test system is comprehensive in function, flexible in test mode, and highly stable, which can meet the test requirements of various types of automotive BCM. The test system has the following characteristics:
1. The test system has an open architecture, modular design, and high integration. The number of input and output signal channels can be arbitrarily expanded to match the needs of different test environments.
2. The test system supports custom test table templates, configures test channels, edits test plans, has data analysis functions, and test results support data and graphics presentation.
3. The test system hardware includes different power segments and different functional applications. The test system software can be highly customized and the test function can be flexibly expanded.