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Semiconductor/IC

NGI provides mature test solutions to the needs of semiconductor manufacturers. In terms of test accuracy and efficiency, NGI instruments are quite competitive, with high quality service and high cost performance.

Test objects: IC chip, diode, triode, MOS tube, thyristor, etc.

Test items: turn-on voltage test, overcurrent capability test, aging test, electrical leakage test, breakdown test.


  • Semiconductor monomer test

  • IC chip test


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