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N23010-reeks hoë presisie multikanaal programmeerbare GS-kragtoevoer
N23010-reeks hoë presisie multikanaal programmeerbare GS-kragtoevoer
N23010-reeks hoë presisie multikanaal programmeerbare GS-kragtoevoer
N23010-reeks hoë presisie multikanaal programmeerbare GS-kragtoevoer

N23010-reeks hoë presisie multikanaal programmeerbare GS-kragtoevoer


N23010 series is a high-precision, multi-channel programmable DC power supply specially developed for the semiconductor industry, which can provide high-precision, stable and pure power for chips, and cooperate with the environmental test chamber for a number of environmental reliability tests. Its voltage accuracy up to 0.01%, support μA level current measurement, up to 24 channels for single unit, support local/remote (LAN/RS232/CAN) control, to meet the needs of chip batch, automatic testing.

Deel na:
Belangrikste kenmerke

● Spanning akkuraatheid 0.6mV

● Langtermyn stabiliteit 80ppm/1000h

●Tot 24 kanale vir enkel eenheid

● Spanning rimpel geraas ≤2mVrms

●Standaard 19-duim 3U-onderstel

●Ontwikkel vir die halfgeleierbedryf



Aansoek Fields

Aflaai (2)

Funksies en voordele

Akkuraatheid en stabiliteit Verseker toetsbetroubaarheid

Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms, can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test.

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Ultrahoë integrasie, bespaar gebruikersbelegging

In the process of chip R&D, flow sheet and mass production, Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testing.

Vinnige dinamiese reaksie

N23010 is provided fast dynamic response capability, under the full voltage output, the load changes from 10% to 90%, voltage recovery to the original voltage reduction within 50mV time is less then 200μs, to ensure that the voltage or current rise waveform within high speed and no over impulse, to provide stable power supply for the chip under test.

Redigering van volgorde

N23010 supports sequence editing function. Users can set output voltage, output current and single step running time. 100 groups of voltage and current sequences can be customized locally.

Aflaai (1)

Verskeie kommunikasie-koppelvlakke, voldoen aan die vereiste van outomatiese toets

support RS232, LAN, CAN port, convenient for users to build automatic test system.

Databasis
ondersoek

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